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Browsing by Author "Kakushima, Kuniyuki"

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    Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures

    Dou, Chunmeng
    ;
    Lin, Dennis  
    ;
    Vais, Abhitosh  
    ;
    Ivanov, Tsvetan  
    ;
    Chen, Han-Ping
    ;
    Martens, Koen  
    Journal article
    2014, Microelectronics Reliability, (54) 4, p.746-754

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