Browsing by Author "Kamezawa, C."

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Degradation of SiC-MESFETs by irradiation

Ohyama, H.
;
Takakura, K.
;
Uemura, K.
;
Shigaki, K.
;
Kudou, T.
;
Matsumoto, T.
;
Arai, M.
;
Kuboyama, S.
Journal article
2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.175-178
Radiaton damage of SiC Schotttky diodes by electron irradiation

Ohyama, H.
;
Takakura, K.
;
Watanabe, T.
;
Nishiyama, K.
;
Shigaki, K.
;
Kudou, T.
;
Nakabayashi, M.
Journal article
2005, Journal of Materials Science: Materials in Electronics, (6) 7, p.455-458