Publication:

Degradation of SiC-MESFETs by irradiation

Date

2008
Journal article
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Author(s)

Ohyama, H.
;
Takakura, K.
;
Uemura, K.
;
Shigaki, K.
;
Kudou, T.
;
Matsumoto, T.
;
Arai, M.
;
Kuboyama, S.
;
Kamezawa, C.
;
Simoen, Eddy  
;
Claeys, Cor

Journal

Journal of Materials Science: Materials in Electronics

Abstract

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1941 since deposited on 2021-10-17
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