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Browsing by Author "Kanev, Stojan"

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    Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs

    Thaerigen, Thomas
    ;
    Kanev, Stojan
    ;
    Kiesewetter, Joerg
    ;
    Hanaway, Peter
    ;
    Strid, Eric
    Proceedings paper
    2011-10, Semicon 13th European Manufacturing Test Conference - EMTC, 12/10/2011

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