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Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
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Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
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Date
2011-10
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Thaerigen, Thomas
;
Kanev, Stojan
;
Kiesewetter, Joerg
;
Hanaway, Peter
;
Strid, Eric
;
Marinissen, Erik Jan
;
Dupas, Luc
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1925
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Acq. date: 2026-01-11
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Views
1925
since deposited on 2021-10-19
3
last month
Acq. date: 2026-01-11
Citations