Browsing by Author "Kang, J."
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Publication Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
Journal article2017, Microelectronic Engineering, 178, p.56-59Publication Multimode resistive switching in nanoscale hafnium oxide stack as studied by atomic force microscopy
; ; ; Publication Sub-10 nm low current resistive switching behavior in hafnium oxide stack
; ; ; ; Youssef, AhmedJournal article2016, Applied Physics Letters, (108) 12, p.123106