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Browsing by Author "Kang, J.F."

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    Mechanism of positive-bias temperature instability in sub-1 nm TaN/HfN/HfO2 gate stack with low preexisting traps

    Sa, N.
    ;
    Kang, J.F.
    ;
    Yang, H.
    ;
    Liu, X.Y.
    ;
    He, Y.D.
    ;
    Han, R.Q.
    ;
    Ren, C.
    ;
    Yu, HongYu
    ;
    Chan, D.S.H.
    ;
    Kwong, D.-L.
    Journal article
    2005-09, IEEE Electron Device Letters, (9) 26, p.610-612

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