Browsing by Author "Kang, J.F."
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Publication Mechanism of positive-bias temperature instability in sub-1 nm TaN/HfN/HfO2 gate stack with low preexisting traps
;Sa, N. ;Kang, J.F. ;Yang, H. ;Liu, X.Y. ;He, Y.D. ;Han, R.Q. ;Ren, C. ;Yu, HongYu ;Chan, D.S.H.Kwong, D.-L.Journal article2005-09, IEEE Electron Device Letters, (9) 26, p.610-612