Browsing by Author "Kanniainen, A."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy
Journal article2025, MICRO AND NANO ENGINEERING, (28) September, p.100307Publication Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
Proceedings paper2019, IEEE International Electron Devices Meeting - IEDM 2019, 7/12/2019, p.90-93