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Browsing by Author "Kapila, Gautam"

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    Direct measurement of top and sidewall interface trap density in SOI FinFETs

    Kapila, Gautam
    ;
    Kaczer, Ben  
    ;
    Nackaerts, Axel
    ;
    Collaert, Nadine  
    ;
    Groeseneken, Guido  
    Journal article
    2007-03, IEEE Electron Device Letters, (28) 3, p.232-234

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