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Direct measurement of top and sidewall interface trap density in SOI FinFETs
Publication:
Direct measurement of top and sidewall interface trap density in SOI FinFETs
Date
2007-03
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kapila, Gautam
;
Kaczer, Ben
;
Nackaerts, Axel
;
Collaert, Nadine
;
Groeseneken, Guido
Journal
IEEE Electron Device Letters
Abstract
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Views
1950
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1950
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations