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Browsing by Author "Kar, Gouri"

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    Publication

    Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

    Van Beek, Simon  
    ;
    Rao, Siddharth  
    ;
    Kundu, Shreya  
    ;
    Kim, Woojin  
    ;
    O'Sullivan, Barry J.
    ;
    Cosemans, Stefan  
    Proceedings paper
    2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021

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