Publication:

Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

Date

2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405209
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Author(s)

Van Beek, Simon  
;
Rao, Siddharth  
;
Kundu, Shreya  
;
Kim, Woojin  
;
O'Sullivan, Barry J.
;
Cosemans, Stefan  
;
Yasin, Farukh
;
Carpenter, Robert  
;
Couet, Sebastien  
;
Sharifi, Shamin H.
;
Jossart, Nico  
;
Crotti, Davide  
;
Kar, Gouri

Journal

na

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1894 since deposited on 2021-11-02
Acq. date: 2026-01-08

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1894 since deposited on 2021-11-02
Acq. date: 2026-01-08

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