Publication:
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Rao, Siddharth | |
| dc.contributor.author | Kundu, Shreya | |
| dc.contributor.author | Kim, Woojin | |
| dc.contributor.author | O'Sullivan, Barry J. | |
| dc.contributor.author | Cosemans, Stefan | |
| dc.contributor.author | Yasin, Farukh | |
| dc.contributor.author | Carpenter, Robert | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.author | Sharifi, Shamin H. | |
| dc.contributor.author | Jossart, Nico | |
| dc.contributor.author | Crotti, Davide | |
| dc.contributor.author | Kar, Gouri | |
| dc.contributor.imecauthor | Van Beek, Simon | |
| dc.contributor.imecauthor | Rao, Siddharth | |
| dc.contributor.imecauthor | Kundu, Shreya | |
| dc.contributor.imecauthor | Kim, Woojin | |
| dc.contributor.imecauthor | O'Sullivan, Barry J. | |
| dc.contributor.imecauthor | Cosemans, Stefan | |
| dc.contributor.imecauthor | Yasin, Farukh | |
| dc.contributor.imecauthor | Carpenter, Robert | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Sharifi, Shamin H. | |
| dc.contributor.imecauthor | Jossart, Nico | |
| dc.contributor.imecauthor | Crotti, Davide | |
| dc.contributor.imecauthor | Kar, Gouri | |
| dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
| dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
| dc.contributor.orcidimec | Carpenter, Robert::0000-0003-0101-5952 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.date.accessioned | 2022-01-28T10:37:52Z | |
| dc.date.available | 2021-11-02T15:58:24Z | |
| dc.date.available | 2022-01-28T10:32:56Z | |
| dc.date.available | 2022-01-28T10:37:52Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/IRPS46558.2021.9405209 | |
| dc.identifier.eisbn | 978-1-7281-6893-7 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37682 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 21-24, 2021 | |
| dc.source.conferencelocation | Monterey, CA, USA | |
| dc.source.journal | na | |
| dc.source.numberofpages | 5 | |
| dc.title | Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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