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Browsing by Author "Karl, A."

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    Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors

    Illarionov, Yu. Yu.
    ;
    Karl, A.
    ;
    Smets, Quentin  
    ;
    Kaczer, Ben  
    ;
    Knobloch, T.
    ;
    Panarella, Luca  
    Journal article
    2024-FEB 2, NPJ 2D MATERIALS AND APPLICATIONS, (8) 1, p.8

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