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Browsing by Author "Karl, Alexander"

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    Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

    Waldhoer, Dominic
    ;
    Schleich, Christian
    ;
    Michl, Jakob
    ;
    Grill, Alexander  
    ;
    Claes, Dieter  
    Journal article
    2023, MICROELECTRONICS RELIABILITY, (146) July, p.Art. 115004

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