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Browsing by Author "Kattouw, Hans"

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    Lithography and yield sensitivity analysis of SRAM scaling for the 32-nm node.

    Nackaerts, Axel
    ;
    Verhaegen, Staf
    ;
    Dusa, Mircea  
    ;
    Kattouw, Hans
    ;
    van Bilsen, Frank
    Proceedings paper
    2007, Design for Manufacturability through Design-Process Integration, 28/02/2007, p.65210N

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