Browsing by Author "Kelly, Thomas F."

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Atom-probe-tomographic studies on silicon-based semiconductor devices

Inoue, Koji
;
Kambham, Ajay Kumar
;
Mangelinck, Dominique
;
Lawrence, Dan
;
Kelly, Thomas F.
Journal article
2012, Microscopy Today, (20) 5, p.38-44
Laser pulsing of field evaporation in atom probe tomography

Kelly, Thomas F.
;
Vella, Angela
;
Bunton, Joseph H.
;
Houard, Jonathan
;
Silaeva, Elena P.
Journal article
2014, Current Opinion in Solid State and Materials Science, (18) 2, p.81-89