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Articles
Atom-probe-tomographic studies on silicon-based semiconductor devices
Publication:
Atom-probe-tomographic studies on silicon-based semiconductor devices
Date
2012
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Inoue, Koji
;
Kambham, Ajay Kumar
;
Mangelinck, Dominique
;
Lawrence, Dan
;
Kelly, Thomas F.
Journal
Microscopy Today
Abstract
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1913
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1913
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations