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Browsing by Author "Ker, M.-D."

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    Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate

    Chen, Shih-Hung  
    ;
    Linten, Dimitri  
    ;
    Scholz, Mirko
    ;
    Hellings, Geert  
    ;
    Boschke, Roman
    Proceedings paper
    2014, IEEE International Reliability Physics Symposium - IRPS, 1/06/2014, p.4C.2

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