Browsing by Author "Kerber, M."
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Publication Influence of stress-induced leakage current on reliability of HfSiOx
Journal article2007, IEEE Trans. Device and Materials Reliability, (7) 2, p.310-314Publication Reliability screening oh high-k dielectrics based on voltage ramp stress
Journal article2007, Microelectronics Reliability, (47) 4_5, p.513-517