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Browsing by Author "Kernstock, Christian"

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    Statistical Poly-Si grain boundary model with discrete charging defects and its 2D and 3D implementation for vertical 3D NAND channels

    Degraeve, Robin  
    ;
    Clima, Sergiu  
    ;
    Putcha, Vamsi  
    ;
    Kaczer, Ben  
    ;
    Roussel, Philippe  
    ;
    Linten, Dimitri  
    Proceedings paper
    2015, International Electron Devices Meeting - IEDM, 7/12/2015, p.121-124

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