Publication:
Statistical Poly-Si grain boundary model with discrete charging defects and its 2D and 3D implementation for vertical 3D NAND channels
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1885 since deposited on 2021-10-22
410item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1885 since deposited on 2021-10-22
410item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations