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Browsing by Author "Kerr, Daniel"

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    0.13µm CMOS technology with optimized poly-Si / NO-oxide gate stack

    Kubicek, Stefan  
    ;
    Jansen, Philippe
    ;
    Badenes, Gonçal
    ;
    Schaekers, Marc  
    ;
    Kol'dyaev, Victor
    Proceedings paper
    1999, ULSI Process Integration. Proceedings of the First International Symposium, 17/10/1999, p.193-202
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    Gate stack optimisation for advanced CMOS process

    Kubicek, Stefan  
    ;
    Vandenberghe, Geert  
    ;
    Schaekers, Marc  
    ;
    Kol'dyaev, Victor
    ;
    Jansen, Philippe
    Proceedings paper
    1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.412-415
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    Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides

    Kubicek, Stefan  
    ;
    Henson, W. K.
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    De Keersgieter, An  
    ;
    Badenes, Gonçal
    ;
    Jansen, Philippe
    Proceedings paper
    1999, International Electron Devices Meeting. Technical Digest; 5-8 Dec. 1999; Washington, D.C., USA., p.823-826

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