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Browsing by Author "Kim, Jinju"

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    Electrode process dependent NBTI chracteristics of TiN gate FinFETs

    Kim, Jinju
    ;
    Cho, Moon Ju
    ;
    Pantisano, Luigi
    ;
    Chiarella, Thomas  
    ;
    Togo, Mitsuhiro
    ;
    Horiguchi, Naoto  
    Proceedings paper
    2012-04, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.GD 6.1

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