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Electrode process dependent NBTI chracteristics of TiN gate FinFETs
Publication:
Electrode process dependent NBTI chracteristics of TiN gate FinFETs
Date
2012-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Jinju
;
Cho, Moon Ju
;
Pantisano, Luigi
;
Chiarella, Thomas
;
Togo, Mitsuhiro
;
Horiguchi, Naoto
;
Groeseneken, Guido
;
Lee, ByoungHun
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1914
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations