Browsing by Author "Kimura, Kenji"
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Publication Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states
Journal article2008, Surface and Interface Analysis, (40) 3_4, p.423-426Publication Does NIST database provide reliable effective attenuation lenght for XPS analysis
Oral presentation2007, 6th International Symposium on Atomic Level Characterizations - ALCPublication Influence of elastic scattering of photoelectrons on angle-resolved x-ray photoelectron spectroscopy
Journal article2007-09, Applied Physics Letters, (91) 10, p.104106Publication The analysis of ultra-thin films with HRBS-30
Proceedings paper2010, 21st International Conference on the Application of Accelerators in Research and Industry - CAARI, 8/08/2010