Publication:

Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states

Date

2008

Journal article

Simple item page Full metadata Statistics

Author(s)

;

Nakajima, Kaoru

;

;

Nohira, Hiroshi

;

;

Kobata, Masaaki

;

;

;

Kobayashi, Keisuku

;

Conard, Thierry

;

Vandervorst, Wilfried

Journal

Surface and Interface Analysis

Statistics

1844 since deposited on 2021-10-17

1last month

Acq. date: 2026-02-25