Browsing by Author "Knuyt, G."
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Publication A new method for the analysis of high-resolution SILC data
Journal article2003, Microelectronics Reliability, (43) 9_11, p.1483-1488Publication Investigation of correlations between parameters defining the state of sputtered particles
Proceedings paper1998, SIMS XI - Secondary Ion Mass Spectrometry, 8/09/1997, p.931-934Publication Investigation of the correlation between parameters defining the state of sputtered particles
Oral presentation1997, SIMS XI; 8-12 September 1997; Orlando, Fl., USA.Publication Investigation of the formation of M-2(+)-molecular ions in sputtering processes
Journal article1999, Journal of the American Society for Mass Spectrometry, (10) 3, p.246-253Publication Investigation of the formation process of MCs+-molecular ions during sputtering
Journal article2000, Journal of the American Society for Mass Spectrometry, (11) 7, p.650-658Publication Monte Carlo simulation of the formation of M2+ - molecular ions sputtered from metallic materials
Proceedings paper1998, SIMS XI - Secondary Ion Mass Spectrometry, 8/09/1997, p.895-898Publication Monte Carlo simulation of the formation of M2-+ molecular ions sputtered from metallic materials
Oral presentation1997, SIMS XI; 8-12 September 1997; Orlando, Fl., USA.Publication Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions
Journal article1998, Journal of the American Society for Mass Spectrometry, (9) 6, p.638-642Publication The characteristics of photon and phonon standing waves in a periodic medium
Publication Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements
Journal article2005, Microelectronic Engineering, 80, p.182-185