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A new method for the analysis of high-resolution SILC data
Publication:
A new method for the analysis of high-resolution SILC data
Date
2003
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aresu, Stefano
;
De Ceuninck, Ward
;
Knuyt, G.
;
Mertens, Jan
;
Manca, Jean
;
De Schepper, Luc
;
Degraeve, Robin
;
Kaczer, Ben
;
D'Olieslaeger, Marc
;
D'Haen, Jan
Journal
Microelectronics Reliability
Abstract
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1972
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1972
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations