Publication:

A new method for the analysis of high-resolution SILC data

Date

2003
Journal article
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dc.contributor.authorAresu, Stefano
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorKnuyt, G.
dc.contributor.authorMertens, Jan
dc.contributor.authorManca, Jean
dc.contributor.authorDe Schepper, Luc
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.authorD'Haen, Jan
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorMertens, Jan
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-15T03:59:02Z
dc.date.available2021-10-15T03:59:02Z
dc.date.embargo9999-12-31
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7145
dc.source.beginpage1483
dc.source.endpage1488
dc.source.issue9_11
dc.source.journalMicroelectronics Reliability
dc.source.volume43
dc.title

A new method for the analysis of high-resolution SILC data

dc.typeJournal article
dspace.entity.typePublication
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