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Browsing by Author "Kobayashi, K."

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    20-MeV alpha ray effects in AlGaAsP p-HEMTs

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kobayashi, K.
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    Yoneoka, M.
    Proceedings paper
    2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.133-138
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    Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons

    Kobayashi, K.
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    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Takami, Y.
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    Simoen, Eddy  
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    Poyai, Amporn
    Oral presentation
    2000, BIAMS - 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors; 12-16 November 2000; Fukuo
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    Defect assessment of irradiated STI diodes

    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Miura, T.
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    Simoen, Eddy  
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    Claeys, Cor
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    Poyai, Amporn
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
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    Defect assessment of irradiated STI Diodes

    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Miura, T.
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    Simoen, Eddy  
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    Claeys, Cor
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    Poyai, Amporn
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.424-428
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    Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Kuroda, S.
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    Claeys, C.
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    Takami, Y.
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    Hakata, T.
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    Kobayashi, K.
    Journal article
    2001, Microelectronics Reliability, (41) 1, p.79-85
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    Degradation and recovery of Si1-xGex devices by irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Kudo, T.
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    Hakata, T.
    Proceedings paper
    1995, Strained Layer Epitaxy - Materials, Processing and Device Applications, 17/04/1995, p.365-371
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    Effects of mechanical stress on polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Ikegami, M.
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    Claeys, Cor
    ;
    Kobayashi, K.
    Journal article
    2002, Thin Solid Films, (406) 1_2, p.195-199
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    High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation

    Poyai, Amporn
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Hayama, Kiyoteru
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    Kobayashi, K.
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    Ohyama, Hidenori
    Proceedings paper
    2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.193-203
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    Impact of 20-MeV alpha ray irradiation on V-band performance of AlGaAs pseudomorphic HEMTs

    Ohyama, Hidenori
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    Yajima, K.
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    Simoen, Eddy  
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    Kato, T.
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    Claeys, Cor
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    Takami, Y.
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    Kobayashi, K.
    Journal article
    2000, IEEE Trans. Nuclear Science, (47) 6, p.2546-2550
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    Impact of high-energy particle irradiation on polycrystalline silicon films

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, C.
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    Tanaka, K.
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    Kobayashi, K.
    Proceedings paper
    2001, GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;, p.471-476
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    Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs

    Hakata, T.
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    Ohyama, Hidenori
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    Kuroda, S.
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    Simoen, Eddy  
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    Claeys, C.
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    Kudou, T.
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    Kobayashi, K.
    Journal article
    1999, Physica B, 274, p.1034-1036
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    Impact of neutron irradiation on optical performance of InGaAsP laser diodes

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Sunaga, H.
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    Yoneoka, M.
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    Nakabayashi, M.
    Journal article
    2000, Thin Solid Films, (364) 1_2, p.259-263
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    Impact of the Ge content on the radiation hardness of hetero-junction diodes in SiGe strained layers

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Takami, Y.
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    Hayama, Kiyoteru
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    Hakata, T.
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    Tokuyama, J.
    Proceedings paper
    1998, Epitaxy and Applications of Si-Based Heterostructures, 13/04/1998, p.99-104
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    Influence of mechanical stress on the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Kobayashi, K.
    ;
    Yoneoka, M.
    ;
    Simoen, Eddy  
    ;
    Claeys, C.
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    Takami, Y.
    Oral presentation
    2000, MRS Spring Meeting 2000. Symposium A:Amorphous and Heterogeneous Silicon Thin Films - 2000; 24-28 April 2000; San Francisco, Ca,
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    Influence of the substrate on the degradation of irradiated Si diodes

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Hayama, Kiyoteru
    Journal article
    1996, Physica Status Solidi A, 156, p.215-223
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    Irradiation induced lattice defects in Si1-xGex epitaxial devices

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Kudo, T.
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    Hakata, T.
    Proceedings paper
    1995, ICDS-18. Proceedings 18th International Conference on Defects in Semiconductors, 23/07/1995, p.371-376
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    Mechanical stress of the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, N.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Ikegami, M.
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    Claeys, Cor
    ;
    Kobayashi, K.
    Journal article
    2001, Journal of Materials Research, (16) 9, p.2579-2582
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    Proton irradiation induced lattice defects in Si diodes and their effects on device performance

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
    Proceedings paper
    1997, Crystalline Defects and Contamination Control: Their Impact and Control in Device Manufacturing II, 31/08/1997, p.143-150
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    Proton-irradiation effect on the electric-field enhancement of the generation lifetime in shallow p-n junction diodes

    Poyai, Amporn
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Hayama, Kiyoteru
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    Kobayashi, K.
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    Ohyama, Hidenori
    Proceedings paper
    2001, Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing III. DECON 2001, p.93-102
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    Radiation damage in flash memory cells

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, C.
    ;
    Nakabayashi, M.
    ;
    Kobayashi, K.
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
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