Browsing by Author "Kocak, Husnu Murat"
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors
Proceedings paper2022, 34th IEEE International Conference on Microelectronic Test Structures (ICMTS), MAR 21-APR 15, 2022, p.21-29Publication Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks
Proceedings paper2021-08, 9th IEEE International Conference on Big Data (IEEE BigData), DEC 15-18, 2021, p.4731-4737Publication Machine Learning-Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks
Journal article2024, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, (37) 4, p.615-619