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Conference contributions
Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks
Publication:
Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks
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Date
2021-08
Proceedings Paper
https://doi.org/10.1109/BigData52589.2021.9671667
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kocak, Husnu Murat
;
Naskali, Ahmet Teoman
;
Pinarer, Ozgun
;
Mitard, Jerome
Journal
na
Abstract
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1471
since deposited on 2022-07-02
Acq. date: 2025-12-15
Citations
Metrics
Downloads
283
since deposited on 2022-07-02
32
last month
7
last week
Acq. date: 2025-12-15
Views
1471
since deposited on 2022-07-02
Acq. date: 2025-12-15
Citations