Publication:

Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks

Date

2021-08
Proceedings Paper
https://doi.org/10.1109/BigData52589.2021.9671667
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dc.contributor.authorKocak, Husnu Murat
dc.contributor.authorNaskali, Ahmet Teoman
dc.contributor.authorPinarer, Ozgun
dc.contributor.authorMitard, Jerome
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2022-09-22T13:21:52Z
dc.date.available2022-07-02T02:26:06Z
dc.date.available2022-09-06T16:05:54Z
dc.date.available2022-09-22T13:21:52Z
dc.date.issued2021-08
dc.identifier.doi10.1109/BigData52589.2021.9671667
dc.identifier.eisbn978-1-6654-3902-2
dc.identifier.issn2639-1589
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40041
dc.publisherIEEE
dc.source.beginpage4731
dc.source.conference9th IEEE International Conference on Big Data (IEEE BigData)
dc.source.conferencedateDEC 15-18, 2021
dc.source.conferencelocationvirtual
dc.source.endpage4737
dc.source.journalna
dc.source.numberofpages7
dc.title

Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks

dc.typeProceedings paper
dspace.entity.typePublication
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