Browsing by Author "Koenraad, Paul"
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Publication Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory
Journal article2017, ACS Applied Materials & Interfaces, (9) 12, p.10820-10824Publication The synergy of AFM and SIMS for advanced characterization of Li-ion battery cathodes
Proceedings paper2017, E-MRS Spring Meeting, 22/05/2017