Publication:
Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1917 since deposited on 2021-10-24
429item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1917 since deposited on 2021-10-24
429item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations