Publication:

Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory

Date

2017
Journal article
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dc.contributor.authorCelano, Umberto
dc.contributor.authorOp de Beeck, Jonathan
dc.contributor.authorClima, Sergiu
dc.contributor.authorLuebben, Michael
dc.contributor.authorKoenraad, Paul
dc.contributor.authorGoux, Ludovic
dc.contributor.authorValov, Ilia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorOp de Beeck, Jonathan
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecOp de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-24T03:21:13Z
dc.date.available2021-10-24T03:21:13Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn1944-8244
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27991
dc.identifier.urlhttp://pubs.acs.org/doi/abs/10.1021/acsami.6b16268
dc.source.beginpage10820
dc.source.endpage10824
dc.source.issue12
dc.source.journalACS Applied Materials & Interfaces
dc.source.volume9
dc.title

Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory

dc.typeJournal article
dspace.entity.typePublication
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