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Browsing by Author "Kokkoris, M."

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    Degradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation

    Simoen, Eddy  
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    Rafi, Joan Marc
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    Mercha, Abdelkarim  
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    De Meyer, Kristin  
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    Claeys, Cor
    ;
    Kokkoris, M.
    Proceedings paper
    2003, Proceedings of the 18th Symposium on Microelectronics Technology and Devices - SBMICRO, 8/09/2003, p.18-27
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    Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation

    Hayama, K.
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    Takakura, K.
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    Ohyama, H.
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    Mercha, Abdelkarim  
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    Simoen, Eddy  
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    Claeys, Cor
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    Rafi, J.M.
    Journal article
    2004, Microelectronics Reliability, (44) 9_11, p.1721-1726
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    DLTS and PL studies of proton radiation defects in TiN-doped FZ silicon

    Simoen, Eddy  
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    Claeys, Cor
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    Privitera, Vittorio
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    Coffa, S.
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    Kokkoris, M.
    ;
    Kossionides, E.
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, 186, p.19-23
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    DLTS PL studies of proton radiation defects in tin-doped FZ silicon

    Simoen, Eddy  
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    Claeys, C.
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    Privitera, Vittorio
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    Coffa, S.
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    Kokkoris, M.
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    Kossionides, E.
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
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    High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation

    Poyai, Amporn
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    Simoen, Eddy  
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    Claeys, Cor
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    Hayama, Kiyoteru
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    Kobayashi, K.
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    Ohyama, Hidenori
    Proceedings paper
    2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.193-203
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    Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs

    Hayama, K.
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    Takakura, K.
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    Ohyama, H.
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    Rafi, J.M.
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    Mercha, Abdelkarim  
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    Simoen, Eddy  
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    Claeys, Cor
    Journal article
    2004, IEEE Trans. Nuclear Science, (51) 6, p.3795-3800
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    On the dechannelling of protons in Si(110)

    Kokkoris, M.
    ;
    Perdikakis, G.
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    Kossionides, S.
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    Petrovic, S.
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    Simoen, Eddy  
    Journal article
    2003, European Physical Journal B, (34) 3, p.257-263
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    On the radiation damage effects in semiconductors beyond the end of range of implanted protons at high energies and fluences

    Kokkoris, M.
    ;
    Spyroua, A.
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    Perdikakisa, G.
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    Lagoyannis, A.
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    Papadopoulos, C.T.
    Oral presentation
    2004, ECAART-8: 8th European Conference on Accelerators in Applied Research and Technology
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    Radiation damage in deep submicron partially depleted SOI CMOS

    Simoen, Eddy  
    ;
    Rafi, Joan Marc
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    Mercha, Abdelkarim  
    ;
    Serra-Gallifa, Xavier
    ;
    van Meer, Hans
    Proceedings paper
    2003, Silicon-on-Insulator Technology and Devices XI, 28/04/2003, p.437-442

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