Publication:

Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs

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2032 since deposited on 2021-10-15
4last month
1last week
Acq. date: 2025-12-11

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2032 since deposited on 2021-10-15
4last month
1last week
Acq. date: 2025-12-11

Citations