Publication:
Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs
Date
| dc.contributor.author | Hayama, K. | |
| dc.contributor.author | Takakura, K. | |
| dc.contributor.author | Ohyama, H. | |
| dc.contributor.author | Rafi, J.M. | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Kokkoris, M. | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-15T13:44:33Z | |
| dc.date.available | 2021-10-15T13:44:33Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9007 | |
| dc.source.beginpage | 3795 | |
| dc.source.endpage | 3800 | |
| dc.source.issue | 6 | |
| dc.source.journal | IEEE Trans. Nuclear Science | |
| dc.source.volume | 51 | |
| dc.title | Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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