Browsing by Author "Konrad, A."

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Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.
;
Esmark, K.
;
Reynders, K.
;
Zubeidat, M.
;
Graf, M.
;
Wilkening, W.
;
Willemen, J.
;
Qu, D.
Journal article
2005, Microelectronics Reliability, (45) 2, p.269-277
Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Stadler, Wolfgang
;
Esmark, K.
;
Reynders, K.
;
Zuhbeidat, M.
;
Graf, M.
;
Wilkening, W.
;
Willemen, J.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.319-327