Publication:

Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Date

2005
Journal article
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Author(s)

Stadler, W.
;
Esmark, K.
;
Reynders, K.
;
Zubeidat, M.
;
Graf, M.
;
Wilkening, W.
;
Willemen, J.
;
Qu, D.
;
Mettler, S.
;
Etherton, M.
;
Nuernbergk, D.
;
Wolf, H.
;
Gieser, H.
;
Soppa, W.
;
De Heyn, Vincent  
;
Mahadeva Iyer, Natarajan
;
Groeseneken, Guido  
;
Morena, E.
;
Stella, I.
;
Andreini, A.
;
Litzenberger, M.
;
Pogany, D.
;
Gornik, E.
;
Foss, C.
;
Konrad, A.
;
Frank, M.

Journal

Microelectronics Reliability

Abstract

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