Browsing by Author "Kosik, R."
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Publication Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
;Grasser, Tibor ;Waltl, Michael ;Wimmer, Yannick ;Goes, Wolfgang ;Kosik, R.Rzepa, GerhardProceedings paper2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.535-538