Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Kosik, R."

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

    Grasser, Tibor
    ;
    Waltl, Michael
    ;
    Wimmer, Yannick
    ;
    Goes, Wolfgang
    ;
    Kosik, R.
    ;
    Rzepa, Gerhard
    Proceedings paper
    2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.535-538

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings