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Browsing by Author "Kraitchinskii, A."

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    A deep level study of high-temperature electron-irradiated n-type Cz silicon

    Simoen, Eddy  
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    Claeys, Cor
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    Neimash, V.
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    Kraitchinskii, A.
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    Kras'ko, M.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    Proceedings paper
    2004, Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003, 21/09/2003, p.367-372
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    A deep level study of high-temperature electron-irradiated n-type Cz silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Tishenko, V.
    ;
    Voitovich, V.
    Oral presentation
    2003, Gettering and Defect Engineering in Semiconductor Technology - GADEST
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    Behavior of n-Si electrical parameters after a high-temperature 1 MeV electron irradiation

    Neimash, V.
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    Kraitchinskii, A.
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    Kras'ko, N.
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    Voitovych, V.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2002, 2nd International Conference on Materials and Coatings for Extreme Performances
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    Deep levels in high-energy proton-irradiated tin-doped n-type Czochralskii silicon

    Simoen, Eddy  
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    Claeys, Cor
    ;
    Neimash, V. B.
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    Kraitchinskii, A.
    ;
    Kras'ko, N.
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    Puzenko, O.
    ;
    Blondeel, A.
    Journal article
    2000, Applied Physics Letters, (76) 20, p.2838-2840
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    DLTS studies of high-temperature electron irradiated Cz n-Si

    Neimash, V.
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    Kras'ko, M.
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    Kraitchinskii, A.
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    Voytivych, V.
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    Tishenko, V.
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    Simoen, Eddy  
    Journal article
    2004, Physica Status Solidi A, (201) 3, p.509-516
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    Electrically active defects in irradiated n-type Czochralski silicon doped with group IV impurities

    David, Marie-Laure
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Neimash, V.
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    Kras'ko, M.
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    Kraitchinskii, A.
    Journal article
    2005, Journal of Physics: Condensed Matter, (17) 22, p.S2255-S2266
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    High-temperature electron irradiation effects on the electrical parameters of n-type Cz silicon

    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, N.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Meeting abstract
    2002, Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting, 5/06/2002, p.CM1-6
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    High-temperature electron-irradiation induced deep levels in n-type Cz silicon

    Simoen, Eddy  
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    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    Meeting abstract
    2003, International Scientific Meeting Belgian Physical Society, 27/05/2003, p.CM1-17
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    Identification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V. B.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Puzenko, O.
    ;
    Blondeel, A.
    Proceedings paper
    2000, General Scientific Meeting Belgische Natuurkundige Vereniging / Société Belge de Physique, 25/05/2000, p.CM41
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    Influence of tin impurities on the generation and annealing of thermal oxygen donors in Czochralski silicon at 450 degrees C

    Neimash, V. B.
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    Kraitchinskii, A.
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    Kras'ko, M.
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    Puzenko, O.
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    Claeys, Cor
    ;
    Simoen, Eddy  
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    Svensson, B.
    Journal article
    2000, Journal of the Electrochemical Society, (147) 7, p.2727-2733
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    On the effect of lead on irradiation induced defects in silicon

    David, M.L.
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    Simoen, Eddy  
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    Claeys, Cor
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    Neimash, V.
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    Kras'ko, M.
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    Kraitchinskii, A.
    ;
    Voytovych, V.
    Proceedings paper
    2005, Gettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting, 25/09/2005, p.373-378
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    Oxygen precipitation and thermal donor formation in Pb and C-doped n-type Czochralski silicon

    Neimash, M.V.
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    Kras'ko, M.
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    Kraitchinskii, A.
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    Voytovych, V.
    ;
    Kabaldin, O.
    ;
    Tsmots, V.
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    Simoen, Eddy  
    Proceedings paper
    2004-10, High Purity Silicon VIII, 3/10/2004, p.286-293
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    Radiation-induced deep levels in lead and tin doped n-type czochralski silicon

    David, Marie-Laure
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    Simoen, Eddy  
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    Claeys, Cor
    ;
    Neimash, V.
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    Kras'ko, M.
    ;
    Kraitchinskii, A.
    Proceedings paper
    2004, High Purity Silicon VIII, 3/10/2004, p.395-406
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    Tin doping effects in silicon

    Simoen, Eddy  
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    Claeys, Cor
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    Neimash, V. B.
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    Kraitchinskii, A.
    ;
    Kras'ko, M.
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    Puzenko, O.
    ;
    Blondeel, A.
    Proceedings paper
    2000, High Purity Silicon VI, 22/10/2000, p.223-235
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    Tin doping of silicon for controlling oxygen precipitation and radiation hardness

    Claeys, Cor
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    Simoen, Eddy  
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    Neimash, V. B.
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    Kraitchinskii, A.
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    Krask'o, M.
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    Puzenko, O.
    ;
    Blondeel, A.
    Journal article
    2001, Journal of the Electrochemical Society, (148) 12, p.G738-G745
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    Tin-related deep levels in proton-irradiated n-type silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V. B.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Puzenko, O.
    ;
    Blondeel, A.
    Proceedings paper
    2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.147-156

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