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Influence of tin impurities on the generation and annealing of thermal oxygen donors in Czochralski silicon at 450 degrees C
Publication:
Influence of tin impurities on the generation and annealing of thermal oxygen donors in Czochralski silicon at 450 degrees C
Date
2000
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Neimash, V. B.
;
Kraitchinskii, A.
;
Kras'ko, M.
;
Puzenko, O.
;
Claeys, Cor
;
Simoen, Eddy
;
Svensson, B.
;
Kuznetsov, A.
Journal
Journal of the Electrochemical Society
Abstract
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1948
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1948
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations