Browsing by Author "Kretzer, Ulrich"
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Publication Defect-induced stress imaging in single and multi-crystalline semiconductor materials
Journal article2018, Materials Today, (5) 6, p.14748-14756Publication Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
Meeting abstract2016-09, Extended Defects in Semiconductors (EDS) Conference, 25/09/2016, p.77