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Browsing by Author "Kroes, K."

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    High-resolution SILC measurements of thin SiO2 at ultra low voltages

    Aresu, S.
    ;
    De Ceuninck, Ward  
    ;
    Dreesen, R.
    ;
    Kroes, K.
    ;
    Andries, E.
    ;
    Manca, Jean
    ;
    De Schepper, Luc
    Journal article
    2002, Microelectronics Reliability, (42) 9_11, p.1485-1489

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