Browsing by Author "Kulkarni, S.R."
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Publication Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
Proceedings paper2008, 8th European Workshop on Radiation Effects on Components and Systems - RADECS, 10/09/2008, p.59-63Publication Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio
Journal article2009, IEEE Transactions on Nuclear Science, (56) 4, p.1926-1930