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Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
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Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
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Date
2008
Proceedings Paper
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17787.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kulkarni, S.R.
;
Schrimpf, R.D.
;
Galloway, K.F.
;
Claeys, Cor
;
Simoen, Eddy
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1934
since deposited on 2021-10-17
Acq. date: 2026-01-07
Citations
Metrics
Views
1934
since deposited on 2021-10-17
Acq. date: 2026-01-07
Citations