Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio

dc.contributor.author	Kulkarni, S.R.
dc.contributor.author	Schrimpf, R.D.
dc.contributor.author	Galloway, K.F.
dc.contributor.author	Claeys, Cor
dc.contributor.author	Simoen, Eddy
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-17T08:04:28Z
dc.date.available	2021-10-17T08:04:28Z
dc.date.embargo	9999-12-31
dc.date.issued	2008
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/13967
dc.source.beginpage	59
dc.source.conference	8th European Workshop on Radiation Effects on Components and Systems - RADECS
dc.source.conferencedate	10/09/2008
dc.source.conferencelocation	Jyväskylä Finland
dc.source.endpage	63
dc.title	Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
dc.type	Proceedings paper
dspace.entity.type	Publication
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